PAT. NO.

Inventors

Title

4

6,809,533

Steven Mark Anlage; David E. Steinhauer; Constantine P. Vlahacos; Frederick C. Wellstood

Quantitative imaging of dielectric permittivity and tunability

3

6,376,836

Steven Mark Anlage ; Bokke Johannes Feenstra ; David Ethan Steinhauer;

Disentangling sample topography and physical properties in scanning near-field microwave microscopy

2

6,366,096

Vladimir V. Talanov; Steven Mark Anlage

Apparatus and method for measuring of absolute values of penetration depth and surface resistance of metals and superconductors

1

5,900,618

Steven Mark Anlage; Frederick Charles Wellstood; Kosta Vlahacos; David E.Steinhauer

Near-field scanning microwave microscope having a transmission line with an open end